品牌:Neocera
Magma EFI includes the highly sensitive SQUID sensor for low current, non-destructive inspection of shorts, leakages and high-resistance opens. Additionally, the EFI tool can detect dead open faults with fantastic accuracy.
| Feature | Details |
| SQUID | |
| Short Defect Localization (SQUID) | 3um |
| Spatial Resolution (SQUID) | 2um |
| Total Scanning Area (SQUID) | At least 100mm by 100mm |
| Current Sensitivity (SQUID) |
|
| Magnetic Sensitivity (SQUID) | 15 pT/√Hz Typical |
| Imaging Depth (SQUID) | 10mm |
| Operating Frequency (SQUID) | DC to 25kHz |
| Opens | |
| Opens Defect Localization (SDR) | 30um |
| Imaging Depth (Opens) | <500um |
| Operating Frequency (Opens) | 20MHz to 200MHz |
| General | |
| IF Function Generator | ±10V @ 100mA |
| IF Function Generator Frequency | DC to 200kHz |
| Camera Resolution | 2um (in NIR or Visible) |
| System Power |
|
| System Operating System | Windows 10 64-bit |
Cost-Effective localization of leakages, shorts and opens in device packages and PCB
The Magma Electronic Fault Isolation (EFI) system is complete package detecting all types of static defects (shorts, leakages, high resistance opens and dead opens) at the package or PC board level (for die level defects, see the EFI HiRes tool). The Magma EFI system extends the features of the Magma SSM tool by adding a technique called space domain reflectometry (SDR). This technique uses radio frequency (RF) standing waves inside of the device to localize dead opens in devices ranging from PC boards to stacked devices and multi-chip modules.
The Magma EFI also features all the capabilities of the Magma SSM tool. The Magma EFI tool utilizes a super-conducting quantum interference device, or SQUID, to detect currents in devices requiring only nanoamps of current. These currents are assembled into an image which can be used in conjunction with optical fiducials and design data to localize static defects in three dimensions.
Imaging with the SQUID is non-destructive. As magnetic fields permeate most materials used in typical devices, there is no need to deprocess the device in any way to begin localizing the failure. Additionally, using such small currents can protect the device under test from further damage and may be the only option when trying to detect failures in circuits with very high resistance (>100kΩ). Typical failures that can be analyzed with the EFI tool include shorts, leakages, resistive opens and dead opens. The system can be used to image AC and/or DC magnetic fields (and likewise, currents) depending on the requirements of the device.
微信二维码
一家总部位于美国阿尔伯克基市的国际性原子层沉积(ALD) 设备制造商;正朝着现代企业的方向与时间一同前进。
以“真诚、务实”为企业宗旨,竭诚为各界人士服务。
Copyright © 厦门公海555000科技有限公司 All Rights Reserved 备案号:闽ICP备15347854号-1